Published Paper Details:

SRAM-based FPGAs are vulnerable to radiation-induced errors, especially Multiple-Bit Upsets (MBUs), which can affect their reliability in space. Existing error correction methods often require too many resources or fail to handle burst errors effectively. Readback scrubbing is thought to be a useful technique for fixing mistakes in Field Programmable Gate Arrays (FPGAs) based on Static-RAM (SRAM). Nevertheless, the error correction %per unit area overhead of the existing systems is modest. In order to attain a high error correction %per unit area overhead, proposed work suggests two novel error detection/correction techniques that combines frame readback scrubbing with multi directionally applied Error Correction Codes (ECCs). According to experiments, the suggested approaches use up to 59.37% less area overhead than other state-of-the-art methods while having an excellent error correction percentage (above 99%), particularly for multi-bit upsets.