Published Paper Details:

The increasing complexity of electronic systems has amplified the importance of ensuring the reliability and functionality of integrated circuits (ICs), which form the foundation of modern digital devices. In many industrial and educational settings, ICs are still tested manually, a process that is time-consuming, error-prone, and inconsistent. These challenges often lead to faulty ICs being overlooked, which can result in critical system failures, increased maintenance costs, and compromised safety in electronic devices. To address these issues, there is a pressing need for an efficient, automated solution that eliminates the limitations of manual testing. Automated IC testers provide consistent, precise, and repeatable testing conditions, reducing the potential for human error and ensuring that only fully functional ICs are approved for use. Such a solution is essential for improving quality assurance practices and supporting applications like digital circuit design, distributed systems, and event-driven architectures. This research focuses on the development of an automated IC tester designed for basic logic gate ICs from the 74LSxx (TTL) and 40xx (CMOS) series. By employing a PIC microcontroller, the tester automates the evaluation of IC functionality and electrical performance, mitigating the risks of system-level failures. The project aligns with the need for accurate and efficient testing processes, contributing to advancements in digital system design and reliability.