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INTERNATIONAL JOURNAL OF CREATIVE RESEARCH THOUGHTS - IJCRT (IJCRT.ORG)

International Peer Reviewed & Refereed Journals, Open Access Journal

IJCRT Peer-Reviewed (Refereed) Journal as Per New UGC Rules.

ISSN Approved Journal No: 2320-2882 | Impact factor: 7.97 | ESTD Year: 2013

Call For Paper - Volume 14 | Issue 7 | Month- July 2026

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  Published Paper Details:

  Paper Title

DESIGNING FAULT-TOLERANT EMBEDDED SYSTEMS FOR CRITICAL APPLICATIONS

  Authors

  Nikin Tharan

  Keywords

Fault tolerance, embedded systems, AI-driven fault detection, real-time self-healing, redundancy management, quantum computing, edge computing, neuromorphic computing, standardization

  Abstract


Fault tolerance is a crucial requirement in embedded systems, particularly in critical applications such as aerospace, automotive safety, healthcare, and industrial automation. These systems must function reliably under extreme conditions while minimizing failure risks. Traditional fault-tolerant techniques, including Triple Modular Redundancy (TMR), checkpointing, and error correction codes (ECC), have limitations in terms of computational overhead, resource constraints, and adaptability to dynamic faults.This paper explores advanced fault-tolerant mechanisms, focusing on AI-driven fault prediction, adaptive redundancy management, and real-time self-healing techniques. A novel AI-based fault-tolerant embedded system is proposed and compared against existing methods, demonstrating higher fault detection accuracy (98%), reduced system recovery time (12ms), and lower computational overhead (18%). Furthermore, future research directions, including quantum computing, edge-based fault tolerance, and neuromorphic computing, are discussed. The study highlights the need for standardized fault-tolerance evaluation frameworks to enhance reliability in safety-critical embedded applications.

  IJCRT's Publication Details

  Unique Identification Number - IJCRT2503083

  Paper ID - 278603

  Page Number(s) - a675-a684

  Pubished in - Volume 13 | Issue 3 | March 2025

  DOI (Digital Object Identifier) -   

  Publisher Name - IJCRT | www.ijcrt.org | ISSN : 2320-2882

  E-ISSN Number - 2320-2882

  Cite this article

  Nikin Tharan,   "DESIGNING FAULT-TOLERANT EMBEDDED SYSTEMS FOR CRITICAL APPLICATIONS", International Journal of Creative Research Thoughts (IJCRT), ISSN:2320-2882, Volume.13, Issue 3, pp.a675-a684, March 2025, Available at :http://www.ijcrt.org/papers/IJCRT2503083.pdf

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Call For Paper July 2026
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ISSN and 7.97 Impact Factor Details


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ISSN: 2320-2882
Impact Factor: 7.97 and ISSN APPROVED
Journal Starting Year (ESTD) : 2013
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ISSN and 7.97 Impact Factor Details


ISSN
ISSN
ISSN: 2320-2882
Impact Factor: 7.97 and ISSN APPROVED
Journal Starting Year (ESTD) : 2013
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