Published Paper Details:

Built-in self-test (BIST ) approaches are suitable for in-field testing since they do not require a tester for storage and application of test data. They also reduce the security vulnerabilities associated with loading and unloading of external test data into scan chains. As technologies evolve, in-field testing needs to address more complex defect and fading mechanisms that require specific deterministic tests. This can be addressed by BIST approaches that store test data on-chip, and use the data for on-chip generation of both random and deterministic tests. In this case, there is a tradeoff between the amount of stored test data and the comprehensiveness of the test set that can be applied. This explores this tradeoff in a specific context that has the following main features. The initial stored test data is based on a stuck-at test set. The target faults are single-cycle gate-exhaustive faults. The stored test data is enhanced gradually by test data based on a gate-exhaustive test set to increase the coverage of gate-exhaustive faults.