Published Paper Details:

On behalf of technology scaling, on-chip memories in a die undergoes bit errors because of single events or multiple cell upsets by the ecological factors such as cosmic radiation, alpha, neutron particles or due to maximum temperature in space, leads to data corruption. Error detection and correction techniques (ECC) recognize and rectify the corrupted data over communication channel. In this paper, an advanced error correction 2-dimensional code based on divide-symbol is proposed to weaken radiationinduced MCUs in memory for space applications. For encoding data bits, diagonal bits, parity bits and check bits were analyzed by XOR operation. To recover the data, again XOR operation was performed between the encoded bits and the recalculated encoded bits. After analyzing, verification, selection and correction process takes place. The proposed scheme was simulated and synthesized using Xilinx Vivado implemented in Verilog HDL. Compared with the well known existing methods, this encoding-decoding process consumes low power and occupies minimum area and delay.