Published Paper Details:

This paper describes a low-power (LP) programmable generator capable of producing pseudorandom test patterns with desired toggling levels and increased fault coverage gradient compared with the best-to-date built-in self-test (BIST)- primarily Based Pseudorandom test pattern generators. It is comprised of a linear finite state machine (a linear feedback shift register or a hoop generator) driving an appropriate phase shifter, and it comes with a variety of features permitting this device to supply binary sequences with preselected toggling (PRESTO) activity. We tend to introduce a technique to automatically choose many controls of the generator offering easy and precise tuning. The identical technique is subsequently used to deterministically guide the generator toward test sequences with improved fault-coverage- to pattern- count ratios. Furthermore, this paper proposes an LP test compression technique that permits shaping the test power envelope in a fully predictable, accurate, and flexible fashion by adapting the PRESTO-based logic BIST (LBIST) infrastructure. The proposed hybrid scheme efficiently combines test compression with LBIST, where both techniques can work synergistically to deliver top quality tests. Experimental results obtained for industrial styles illustrate the feasibility of the proposed test schemes and are reported herein.