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  Published Paper Details:

  Paper Title

Fault Ride Through Capability Of A System Under Critical Voltage Conditions

  Authors

  S.Lavanya Lakshmi,  R.Srinu Naik,  Y.Chittemma,  S.Naveena

  Keywords

Power quality ,Distribution Grid, Fault ride through capability, Voltage sag.

  Abstract


The main goal of this research is to investigate the condition of the voltage when a fault occurs in the system when under faulty conditions or during fault occurrence .This study focuses on optimizing the flow of voltage through the system by providing a ride through capability.And to improve the power qaulity which is provided to the consumer.Here, by implementing a DVR-FRTC we can improve the quality of the power supplied to any system under any fault conditions. A fault ride-through approach for grid-connected systems, aimed at improving the system's response during voltage sags and limiting the maximum inverter current during symmetrical faults. A constant active current reactive power injection approach was developed for low-voltage ride-through (LVRT) operation of grid-connected system in low voltage grids. The method manages the active and reactive power references and satisfies grid code requirements The faults that we deal here are the voltage sags that occur during the switching the equipment or during the sudden load change the operation.This research examines the perfomance of the system when applied with DVR-FRTC and without it under different sag levels .This resaerch outcome specifies the adaptability of a system to perfom better under any faulty conditions.These tests are performed using MATLAB/SIMULINK to oberve the work of the Fault ride through capability.

  IJCRT's Publication Details

  Unique Identification Number - IJCRT2311205

  Paper ID - 246156

  Page Number(s) - b740-b747

  Pubished in - Volume 11 | Issue 11 | November 2023

  DOI (Digital Object Identifier) -   

  Publisher Name - IJCRT | www.ijcrt.org | ISSN : 2320-2882

  E-ISSN Number - 2320-2882

  Cite this article

  S.Lavanya Lakshmi,  R.Srinu Naik,  Y.Chittemma,  S.Naveena,   "Fault Ride Through Capability Of A System Under Critical Voltage Conditions", International Journal of Creative Research Thoughts (IJCRT), ISSN:2320-2882, Volume.11, Issue 11, pp.b740-b747, November 2023, Available at :http://www.ijcrt.org/papers/IJCRT2311205.pdf

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ISSN: 2320-2882
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Journal Starting Year (ESTD) : 2013
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ISSN and 7.97 Impact Factor Details


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ISSN
ISSN: 2320-2882
Impact Factor: 7.97 and ISSN APPROVED
Journal Starting Year (ESTD) : 2013
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