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  Published Paper Details:

  Paper Title

PERFORMANCE ANALYSIS OF NON IDEAL BEHAVIOUR OF MOSFET WORKING

  Authors

  PANKAJ BATRA

  Keywords

MOSFET, DBIL,Velocity Saturation, Threshold voltage,surface scattering,impact ionization

  Abstract


One of the most widely used electronic devices,particularly in digital integrated circuits, is the metal insulator semiconductor(MIS) transistor. In this device the channel current is controlled by a voltage applied at a gate electrode that is isolated from the channel by an insulator.The resulting device may be referred to generically as an insulated gate field effect transistor(IGFET).The main drives for reducing the size of the transistors, i.e., their lengths, is increasing speed and reducing cost. When you make circuits smaller, their capacitance reduces, thereby increasing operating speed. In the same token, smaller circuits allow more of them in the same wafer, dividing the total cost of a single wafer among more dies.However, with great reduction come great problems, in this case in the form of unwanted side effects, the so called short-channel effects. When the channel of the MOSFET becomes the same order of magnitude as the depletion layer width of source and drain, the transistors start behaving differently, which impacts performance, modeling and reliability.

  IJCRT's Publication Details

  Unique Identification Number - IJCRT1705218

  Paper ID - 180976

  Page Number(s) - 1535-1540

  Pubished in - Volume 6 | Issue 1 | January 2018

  DOI (Digital Object Identifier) -   

  Publisher Name - IJCRT | www.ijcrt.org | ISSN : 2320-2882

  E-ISSN Number - 2320-2882

  Cite this article

  PANKAJ BATRA,   "PERFORMANCE ANALYSIS OF NON IDEAL BEHAVIOUR OF MOSFET WORKING", International Journal of Creative Research Thoughts (IJCRT), ISSN:2320-2882, Volume.6, Issue 1, pp.1535-1540, January 2018, Available at :http://www.ijcrt.org/papers/IJCRT1705218.pdf

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ISSN: 2320-2882
Impact Factor: 7.97 and ISSN APPROVED
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