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  Published Paper Details:

  Paper Title

MODERN DESIGN APPROACH OF REDUCED ORDERED BINARY DECISION DIAGRAM (ROBDD) FOR TESTING MULTIPLE STUCK-AT FAULTS IN DIGITAL BLOCKS

  Authors

  DR. ARVIND KUNDU,  G.NARESH,  MACHA BABU RAO

  Keywords

Multiple faults, ROBDD, combinational logic

  Abstract


The test pattern for a multiple fault is the special test pattern for the special single stuck-at fault forming the multiple one. Test for all multiple faults is derived from any test for all single stuck-at faults. The length of the multiple faults test is linear function of the single faults test length. A multiple fault test is the one of high quality. In particular SEU and bridge faults may manifest themselves as multiple faults at the CLBs poles. Deriving test for all multiple faults was executed for the certain bench-marks. For them the length of the multiple faults test is about the twice length of the single faults test. The circuit is designed by covering the Shared ROBDD by CLBs. The entire project describes finding multiple faults in combinational logic blocks using ROBDD technique.

  IJCRT's Publication Details

  Unique Identification Number - IJCRT1703044

  Paper ID - 170184

  Page Number(s) - 341-346

  Pubished in - Volume 5 | Issue 3 | September 2017

  DOI (Digital Object Identifier) -   

  Publisher Name - IJCRT | www.ijcrt.org | ISSN : 2320-2882

  E-ISSN Number - 2320-2882

  Cite this article

  DR. ARVIND KUNDU,  G.NARESH,  MACHA BABU RAO,   "MODERN DESIGN APPROACH OF REDUCED ORDERED BINARY DECISION DIAGRAM (ROBDD) FOR TESTING MULTIPLE STUCK-AT FAULTS IN DIGITAL BLOCKS", International Journal of Creative Research Thoughts (IJCRT), ISSN:2320-2882, Volume.5, Issue 3, pp.341-346, September 2017, Available at :http://www.ijcrt.org/papers/IJCRT1703044.pdf

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ISSN: 2320-2882
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Journal Starting Year (ESTD) : 2013
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ISSN and 7.97 Impact Factor Details


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ISSN: 2320-2882
Impact Factor: 7.97 and ISSN APPROVED
Journal Starting Year (ESTD) : 2013
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